Instruments Managed by CAMP

Scanning Electron Microscopy (SEM)

Transmission Electron Microscopy (TEM)

Atomic Force Microscopy (AFM)

Power X-ray Diffractometer (XRD)

X-ray Fluorescence

Thermogravimetric analysis (TGA)

Differential Scanning Calorimetry (DSC)

Dynamic Mechanical Analysis (DWA)

Thermo-Mechanical Analyzer (TMA)

Particle Size Analysis (DLS, Laser Diffraction)

CAMP SEM machine

Instruments managed by other faculty/departments that are available for use:


Single Crystal X-ray Diffractometer

Nuclear Magnetic Resonance (NMR) Spectrometer

Raman Spectrometer/Microscope


CAMP is sponsored by:

The Center for Advanced Materials Processing at Clarkson University is a NYSTAR designated Center for Advanced Technology