CAMP's instrumental facilities are establish to address the many characterization needs of research projects happening across Clarkson University's Campus and New York State businesses. With a focus on material properties, CAMP specializes in microscopy (SEM, TEM, AFM), microanalysis (EDS, XRF, XRD) and thermal analytics (DMA, TGA, DSC). Many of these high end tools are fitted with peripheral attachments in order to perform measurements under different environments with the capability to control atmosphere and temperature. By leveraging faculty demand the CAMP is constantly changing and upgrading instrumentation to better refine the characterization technologies being offered. Thorough training, analytical expertise, and our knowledgeable technical staff provide analytical solutions to a wide range of material related problems.
CAMP instrument update (Jan. 2021): The new JEOL JSM 7900-LV SEM is now fully functional. Click on the link below to find out more its capabilities.
Clarkson faculty and staff can book instruments through the EMS system. Potential non-Clarkson users should contact the CAMP office.